ADVANCED PROCESSES
Batch Isotropic Oxidation

One aspect of thermal oxidation that poses myriad challenges as devices shrink to 65nm and beyond is the propensity to deposit at different growth rates on different Si crystal orientations (<1-1-0> and <1-0-0>) and on different underlayer materials (i.e. poly Si and Si3N4). Another barrier in this device realm is the need to reduce processing temperatures as thermal budgets shrink along with the device geometries.

A new isotropic oxidation process developed by Kokusai eliminates these barriers and enables a simple furnace oxidation to be utilized once again for a variety of device applications. Further, the Kokusai solution employs a large batch approach to isotropic oxidation that provides the easiest maintenance and lowest CoO available.

Application

Kokusai System Advantages

STI Liner

Improved corner rounding and elimination of “bird’s beak”

Gate / Tunnel Dielectric Superior device reliability and lower leakage
Inter Poly Dielectric Exceptional Uniformity – less than 1A range across wafer
Metal / Poly Selective Oxidation Oxide growth is selective to metal and poly Si
Monos Gate Oxidation Oxidation of Si3N4 at low temperatures
All Applications

Excellent Uniformity – less than 1 angstrom range across wafer
Large Batch provides lowest CoO
Easy maintenance and highest uptime
Isotropic Growth Rate

- Very similar on <1-1-0> and <1-0-0> orientation
- Very similar on poly Si and Si3N4

Recommended Products

QUIXACE for 300mm
VERTRON for 200mm

Technical Information

 
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